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1

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Reflection, Scattering, and Diffraction from Surfaces IV - Dynamic data driven bidirectional reflectance distribution function measurement system

Hanssen, Leonard M., Nauyoks, Stephen E., Freda, Sam, Marciniak, Michael A.

Year:

2014

Language:

english

File:

PDF, 395 KB

english, 2014

2

Effects of a measurement floor on Mueller matrix measurements in a dual rotating retarder polarimeter bidirectional scatter distribution function system

Nauyoks, Stephen E., Marciniak, Michael A.

Journal:

Year:

2015

Language:

english

File:

PDF, 913 KB

english, 2015

3

Comparison of microfacet BRDF model to modified Beckmann-Kirchhoff BRDF model for rough and smooth surfaces

Butler, Samuel D., Nauyoks, Stephen E., Marciniak, Michael A.

Journal:

Year:

2015

Language:

english

File:

PDF, 1013 KB

english, 2015

4

Stress and dislocations in diamond–SiC composites sintered at high pressure, high temperature conditions

Stephen Nauyoks, Monika Wieligor, T.W. Zerda, Levente Balogh, Tamas Ungar, Peter Stephens

Journal:

Composites Part A: Applied Science and Manufacturing

Year:

2009

Language:

english

File:

PDF, 476 KB

english, 2009

5

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Infrared Remote Sensing and Instrumentation XIX - Development of tunable polarimetric optical scattering instrument from 4.3-9.7 microns

Vap, Jason C., Strojnik, Marija, Paez, Gonzalo, Nauyoks, Stephen E., Fitzgerald, Thomas, Marciniak, Michael A.

Year:

2011

Language:

english

File:

PDF, 341 KB

english, 2011

6

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 12 August 2012)] Plasmonics: Metallic Nanostructures and Their Optical Properties X - Investigation of surface plasmonic extraordinary transmission for spectral, polarimetric, and off-normal incidence

Sellers, Spencer R., Vap, Jason C., Nauyoks, Stephen E., Marciniak, Michael A., Ku, Zahyun, Stockman, Mark I.

Year:

2012

Language:

english

File:

PDF, 1.30 MB

english, 2012

7

Measuring the Reflection Matrix of a Rough Surface

Burgi, Kenneth, Marciniak, Michael, Oxley, Mark, Nauyoks, Stephen

Journal:

Applied Sciences

Year:

2017

Language:

english

File:

PDF, 855 KB

english, 2017

8

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Reflection, Scattering, and Diffraction from Surfaces III - Effects of a measurement floor on Mueller matrix measurements in a DRR BSDF system

Nauyoks, Stephen E., Marciniak, Michael A., Hanssen, Leonard M.

Year:

2012

Language:

english

File:

PDF, 277 KB

english, 2012

9

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Polarization: Measurement, Analysis, and Remote Sensing X - Optimization of a mid-wave tunable polarimetric optical scatter instrument

Vap, Jason C., Nauyoks, Stephen E., Marciniak, Michael A.

Year:

2012

Language:

english

File:

PDF, 286 KB

english, 2012

10

Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materials

Vap, Jason C., Nauyoks, Stephen E., Benson, Michael R., Marciniak, Michael A.

Journal:

Review of Scientific Instruments

Year:

2017

Language:

english

File:

PDF, 9.42 MB

english, 2017

11

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - Development of a tunable polarimetric scatterometry system in the MWIR and LWIR

Fitzgerald, Thomas M., Marciniak, Michael A., Nauyoks, Stephen E., Gu, Zu-Han, Hanssen, Leonard M.

Year:

2010

Language:

english

File:

PDF, 5.00 MB

english, 2010

12

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Reflection, Scattering, and Diffraction from Surfaces V - Matrix methods for reflective inverse diffusion

Hanssen, Leonard M., Burgi, Kenneth W., Marciniak, Michael A., Nauyoks, Stephen E., Oxley, Mark E.

Year:

2016

Language:

english

File:

PDF, 602 KB

english, 2016

13

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - Experimental measurement and analysis of wavelength-dependent properties of the BRDF

Pagano, Thomas S., Silny, John F., Butler, Samuel D., Nauyoks, Stephen E., Marciniak, Michael A.

Year:

2015

Language:

english

File:

PDF, 1.50 MB

english, 2015

14

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 12 August 2012)] Plasmonics: Metallic Nanostructures and Their Optical Properties X - Spectral coherent emission of thermal radiation in the far-field from a truncated resonator

McConnell, Shane N., Seal, Michael D., Nauyoks, Stephen E., Murphy, Neil R., Sun, Lirong, Marciniak, Michael A., Stockman, Mark I.

Year:

2012

Language:

english

File:

PDF, 949 KB

english, 2012

15

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Reflection, Scattering, and Diffraction from Surfaces V - Analysis of wave optics BRDF model elements for a moderately rough surface

Hanssen, Leonard M., Freda, Samuel E., Butler, Samuel D., Nauyoks, Stephen E., Marciniak, Michael A.

Year:

2016

Language:

english

File:

PDF, 739 KB

english, 2016

16

Experimental analysis of bidirectional reflectance distribution function cross section conversion term in direction cosine space

Butler, Samuel D., Nauyoks, Stephen E., Marciniak, Michael A.

Journal:

Year:

2015

Language:

english

File:

PDF, 641 KB

english, 2015

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